Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM - Nobuo Tanaka - Books - Springer Verlag, Japan - 9784431569398 - August 3, 2024
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Nobuo Tanaka
Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM Second Edition 2024 edition

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In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 3, 2024
ISBN13 9784431569398
Publishers Springer Verlag, Japan
Pages 384
Dimensions 150 × 220 × 20 mm   ·   839 g

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