Nanometer Technology Designs: High-Quality Delay Tests - Nisar Ahmed - Books - Springer-Verlag New York Inc. - 9780387764863 - December 20, 2007
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Nisar Ahmed
Nanometer Technology Designs: High-Quality Delay Tests 2008 edition

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Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.

304 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 20, 2007
ISBN13 9780387764863
Publishers Springer-Verlag New York Inc.
Pages 281
Dimensions 164 × 242 × 22 mm   ·   626 g
Language English  

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