Nanometer Technology Designs: High-Quality Delay Tests - Nisar Ahmed - Books - Springer-Verlag New York Inc. - 9781441945594 - December 14, 2011
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Nisar Ahmed
Nanometer Technology Designs: High-Quality Delay Tests 2008 edition

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Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.

281 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 14, 2011
ISBN13 9781441945594
Publishers Springer-Verlag New York Inc.
Pages 281
Dimensions 155 × 235 × 15 mm   ·   421 g
Language English  

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