ESD: Failure Mechanisms and Models - Voldman, Steven H. (IEEE Fellow, Vermont, USA) - Books - John Wiley & Sons Inc - 9780470511374 - July 17, 2009
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Voldman, Steven H. (IEEE Fellow, Vermont, USA)
ESD: Failure Mechanisms and Models

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Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.

408 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 17, 2009
ISBN13 9780470511374
Publishers John Wiley & Sons Inc
Pages 408
Dimensions 253 × 176 × 29 mm   ·   820 g

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