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ESD Testing: From Components to Systems Voldman, Steven H. (IEEE Fellow, Vermont, USA)
ESD Testing: From Components to Systems
Voldman, Steven H. (IEEE Fellow, Vermont, USA)
Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the test systems and testing and specifications of each model, including the RF ESD test systems and magnetic recording (MR) systems and latchup.
352 pages
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | December 2, 2016 |
| ISBN13 | 9780470511916 |
| Publishers | John Wiley & Sons Inc |
| Pages | 336 |
| Dimensions | 175 × 246 × 20 mm · 635 g |