Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Books - Springer - 9780792393061 - December 31, 1992
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Jose Pineda de Gyvez
Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

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The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

167 pages, 48 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 31, 1992
ISBN13 9780792393061
Publishers Springer
Pages 167
Dimensions 155 × 235 × 12 mm   ·   453 g
Language English  

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