Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Books - Springer-Verlag New York Inc. - 9781461363835 - February 23, 2014
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Jose Pineda de Gyvez
Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1993 edition

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The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

191 pages, 48 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 23, 2014
ISBN13 9781461363835
Publishers Springer-Verlag New York Inc.
Pages 167
Dimensions 155 × 235 × 11 mm   ·   281 g
Language English  

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