Yield and Variability Optimization of Integrated Circuits - Jian Cheng Zhang - Books - Springer - 9780792395515 - February 28, 1995
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Jian Cheng Zhang
Yield and Variability Optimization of Integrated Circuits 1995 edition

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Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.

234 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 28, 1995
ISBN13 9780792395515
Publishers Springer
Pages 234
Dimensions 155 × 235 × 15 mm   ·   539 g
Language English  

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