Yield and Variability Optimization of Integrated Circuits - Jian Cheng Zhang - Books - Springer-Verlag New York Inc. - 9781461359357 - November 2, 2012
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Jian Cheng Zhang
Yield and Variability Optimization of Integrated Circuits Softcover reprint of the original 1st ed. 1995 edition

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Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.

234 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 2, 2012
Original release date 1995
ISBN13 9781461359357
Publishers Springer-Verlag New York Inc.
Pages 234
Dimensions 155 × 235 × 13 mm   ·   362 g
Language English  

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