Random Testing of Digital Circuits: Theory and Applications - Rene David - Books - Taylor & Francis Inc - 9780824701826 - April 8, 1998
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Rene David
Random Testing of Digital Circuits: Theory and Applications 1st edition

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"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

496 pages, bibliography, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 8, 1998
ISBN13 9780824701826
Publishers Taylor & Francis Inc
Pages 500
Dimensions 152 × 229 × 29 mm   ·   853 g
Language English  

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