Design for Manufacturability and Yield for Nano-Scale CMOS - Integrated Circuits and Systems - Charles Chiang - Books - Springer-Verlag New York Inc. - 9781402051876 - July 26, 2007
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Charles Chiang
Design for Manufacturability and Yield for Nano-Scale CMOS - Integrated Circuits and Systems 2007 edition

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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

281 pages, bibliography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 26, 2007
ISBN13 9781402051876
Publishers Springer-Verlag New York Inc.
Pages 255
Dimensions 155 × 235 × 18 mm   ·   680 g
Language English  

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