Design for Manufacturability and Yield for Nano-scale Cmos - Integrated Circuits and Systems - Charles Chiang - Books - Springer - 9789048173037 - November 22, 2010
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Charles Chiang
Design for Manufacturability and Yield for Nano-scale Cmos - Integrated Circuits and Systems 1st Ed. Softcover of Orig. Ed. 2007 edition

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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

255 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 22, 2010
ISBN13 9789048173037
Publishers Springer
Pages 255
Dimensions 156 × 234 × 15 mm   ·   408 g
Language English  

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