CTL for Test Information of Digital ICs - Rohit Kapur - Books - Springer-Verlag New York Inc. - 9781402072932 - October 31, 2002
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Rohit Kapur
CTL for Test Information of Digital ICs 2002 edition

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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

173 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 31, 2002
ISBN13 9781402072932
Publishers Springer-Verlag New York Inc.
Pages 173
Dimensions 155 × 235 × 12 mm   ·   439 g
Language English  

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