CTL for Test Information of Digital ICs - Rohit Kapur - Books - Springer-Verlag New York Inc. - 9781475778007 - April 26, 2013
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Rohit Kapur
CTL for Test Information of Digital ICs Softcover reprint of the original 1st ed. 2003 edition

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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

173 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 26, 2013
ISBN13 9781475778007
Publishers Springer-Verlag New York Inc.
Pages 173
Dimensions 155 × 235 × 10 mm   ·   272 g
Language English  

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