CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Frontiers in Electronic Testing - Andrei Pavlov - Books - Springer-Verlag New York Inc. - 9781402083624 - June 21, 2008
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Andrei Pavlov
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Frontiers in Electronic Testing 2008 edition

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The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

210 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 21, 2008
ISBN13 9781402083624
Publishers Springer-Verlag New York Inc.
Pages 194
Dimensions 166 × 239 × 19 mm   ·   476 g
Language English  

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