Neural Models and Algorithms for Digital Testing - The Springer International Series in Engineering and Computer Science - S.T. Chadradhar - Books - Springer-Verlag New York Inc. - 9781461367673 - September 28, 2012
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S.T. Chadradhar
Neural Models and Algorithms for Digital Testing - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1991 edition

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References . . . . . . . . . . . . . . . . . . . . . 2 Notation and Tenninology . 3 Minimization Technique . 4 An Example . 1 Transitive Oosure . 3 Path Sensitization . 100 References . 1 Background . 6 Summary 119 References . 2 Contribution of the Present Work . 139 References . 3 Logic Circuit Modeling . 1 Modelfor a Boolean Gate .

197 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 28, 2012
ISBN13 9781461367673
Publishers Springer-Verlag New York Inc.
Pages 184
Dimensions 155 × 235 × 11 mm   ·   290 g
Language English  

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