Bias Temperature Instability for Devices and Circuits - Tibor Grasser - Books - Springer-Verlag New York Inc. - 9781461479086 - October 23, 2013
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Tibor Grasser
Bias Temperature Instability for Devices and Circuits 2014 edition

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Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

864 pages, 283 black & white illustrations, 318 colour illustrations, 22 black & white tables, biogr

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 23, 2013
ISBN13 9781461479086
Publishers Springer-Verlag New York Inc.
Pages 810
Dimensions 158 × 241 × 50 mm   ·   1.50 kg
Language English  
Editor Grasser, Tibor

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