Electrothermal Analysis of VLSI Systems - Yi-Kan Cheng - Books - Springer-Verlag New York Inc. - 9781475773736 - April 20, 2013
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Electrothermal Analysis of VLSI Systems Softcover reprint of the original 1st ed. 2000 edition

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This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.


210 pages, 36 black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 20, 2013
ISBN13 9781475773736
Publishers Springer-Verlag New York Inc.
Pages 210
Dimensions 155 × 235 × 13 mm   ·   340 g
Language English  

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