Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing - Benoit Nadeau-dostie - Books - Springer-Verlag New York Inc. - 9781475782912 - April 26, 2013
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Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2000 edition

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

239 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 26, 2013
ISBN13 9781475782912
Publishers Springer-Verlag New York Inc.
Pages 239
Dimensions 178 × 254 × 14 mm   ·   458 g
Language English  
Editor Nadeau-Dostie, Benoit

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