Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces - NanoScience and Technology - Gerd Kaupp - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540284055 - August 4, 2006
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Gerd Kaupp
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces - NanoScience and Technology 2006 edition

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.

308 pages, 7 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 4, 2006
ISBN13 9783540284055
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 292
Dimensions 155 × 235 × 19 mm   ·   607 g
Language English  

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