Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces - NanoScience and Technology - Gerd Kaupp - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642066634 - February 12, 2010
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Gerd Kaupp
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces - NanoScience and Technology 1st ed. Softcover of orig. ed. 2006 edition

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.

308 pages, 7 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 12, 2010
ISBN13 9783642066634
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 292
Dimensions 156 × 233 × 20 mm   ·   466 g
Language English  

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