Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science - Johann-Martin Spaeth - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540426950 - January 22, 2003
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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science 2003 edition

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.


492 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 22, 2003
ISBN13 9783540426950
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 492
Dimensions 155 × 235 × 28 mm   ·   884 g
Language English   German  
Contributor Hans-Joachim Queisser

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