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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science Johann-Martin Spaeth 2003 edition
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science
Johann-Martin Spaeth
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.
492 pages, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | January 22, 2003 |
| ISBN13 | 9783540426950 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 492 |
| Dimensions | 155 × 235 × 28 mm · 884 g |
| Language | English German |
| Contributor | Hans-Joachim Queisser |