Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science - Johann-Martin Spaeth - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642627224 - September 14, 2012
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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science Softcover reprint of the original 1st ed. 2003 edition

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.


492 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 14, 2012
ISBN13 9783642627224
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 492
Dimensions 155 × 235 × 25 mm   ·   703 g
Language English  
Contributor Hans-Joachim Queisser

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