Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences - Ludwig Reimer - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540639763 - September 17, 1998
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Ludwig Reimer
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences 2nd completely rev. and updated ed. 1998 edition

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The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

529 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 17, 1998
ISBN13 9783540639763
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 529
Dimensions 242 × 166 × 34 mm   ·   975 g
Language German  
Contributor Peter W Hawkes

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