Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology - Seizo Morita - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642014949 - October 1, 2009
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Seizo Morita
Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology 2009 edition

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

419 pages, 28 black & white illustrations, 77 colour illustrations, 7 black & white tables, biograph

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 1, 2009
ISBN13 9783642014949
Publishers Springer-Verlag Berlin and Heidelberg Gm
Genre Aspects (Academic) > Science / Technology Aspects
Pages 401
Dimensions 155 × 235 × 25 mm   ·   703 g
Language French  
Editor Giessibl, Franz J.
Editor Morita, Seizo
Editor Wiesendanger, Roland

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