Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology - Seizo Morita - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642260704 - March 14, 2012
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Seizo Morita
Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology 2009 edition

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

419 pages, 28 black & white illustrations, 77 colour illustrations, 7 black & white tables, biograph

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 14, 2012
ISBN13 9783642260704
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 401
Dimensions 234 × 157 × 31 mm   ·   585 g
Language French  
Editor Giessibl, Franz J.
Editor Morita, Seizo
Editor Wiesendanger, Roland

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