Photomodulated Optical Reflectance: A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon - Springer Theses - Janusz Bogdanowicz - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642301070 - June 28, 2012
In case cover and title do not match, the title is correct

Janusz Bogdanowicz
Photomodulated Optical Reflectance: A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon - Springer Theses 2012 edition

Price
$ 104.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jul 24 - 30
Get notified about new Janusz Bogdanowicz releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

Also available as:

Among the plethora of measurement techniques, the optical reflectance approach developed in this work is the sole concept that does not require physical contact, making it suitable for non-invasive in-line metrology.

220 pages, 51 black & white illustrations, 23 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 28, 2012
ISBN13 9783642301070
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 204
Dimensions 155 × 235 × 18 mm   ·   453 g
Language French  

More from the same publisher

See all of Janusz Bogdanowicz ( e.g. Paperback Book and Hardcover Book )