Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 - Springer Series in Chemical Physics - A Benninghoven - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642618734 - December 13, 2011
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A Benninghoven
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 - Springer Series in Chemical Physics Softcover reprint of the original 1st ed. 1979 edition

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320 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 13, 2011
ISBN13 9783642618734
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 300
Dimensions 152 × 229 × 17 mm   ·   430 g
Language German  
Editor Benninghoven, A.
Editor Evans, C.A. Jr.
Editor Powell, R.A.
Editor Shimizu, R.
Editor Storms, H.A.

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