Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics - A Benninghoven - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642881541 - July 26, 2012
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Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics Softcover reprint of the original 1st ed. 1982 edition

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Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.


458 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released July 26, 2012
ISBN13 9783642881541
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 447
Dimensions 155 × 235 × 24 mm   ·   639 g
Language German  
Editor Benninghoven, A.
Editor Giber, J.
Editor Laszlo, J.
Editor Riedel, M.
Editor Werner, H.W.

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