Atomic Force Microscopy / Scanning Tunneling Microscopy 2 - Samuel H Cohen - Books - Springer Science+Business Media - 9780306455964 - April 30, 1997
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Atomic Force Microscopy / Scanning Tunneling Microscopy 2 1997 edition

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Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994


250 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 30, 1997
ISBN13 9780306455964
Publishers Springer Science+Business Media
Pages 250
Dimensions 178 × 254 × 16 mm   ·   680 g
Editor Cohen, Samuel H.
Editor Lightbody, Marcia L.

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