Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization - A W Czanderna - Books - Springer Science+Business Media - 9780306458965 - October 31, 1998
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A W Czanderna
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition

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The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

430 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 31, 1998
ISBN13 9780306458965
Publishers Springer Science+Business Media
Pages 430
Dimensions 156 × 234 × 25 mm   ·   811 g
Editor Czanderna, Alvin W.
Editor Madey, Theodore E.
Editor Powell, Cedric J.

Mere med samme udgiver

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